Micromaterial analysis

Micromaterial analysis: Scanning laser OES

LSA GmbH has been developing and marketing systems for spatially resolved micro material analysis for many years. As the market leader for scanning laser OES technology, numerous systems have already been integrated into a wide range of industrial production processes. The aim is to characterize and analyse the processed materials across every manufacturing process based on the spatial distribution of their chemical composition.

The quality of the chemical composition of materials and alloys is analyzed seamlessly across surfaces and, if required, a fully visual chemical map can be generated.

Your advantages:

High precision: Scanning laser OES enables precise and accurate analysis of material compositions at the microscopic level, allowing even narrowly defined, minimal quantities of elements (inclusions) to be detected.
Surface analysis: As the laser beam is directed at the surface of the material, the technology is particularly suitable for analyzing thin layers, coatings or small sample areas.
Multi-element analysis: The laser OES analyzes many elements of the periodic table simultaneously in a single measurement process and thus achieves the highest speeds for spatially resolved analysis of even extended samples.

Non-destructive analysis: The method only requires microscopic amounts of material, which means that the sample remains largely unchanged after analysis. This is particularly important if the sample is valuable or limited.
Wide range of applications: Scanning laser OES is used in various branches of industry for process and quality control: materials testing, metallurgy, semiconductor production and environmental technology.

Micromaterial analysis with scanning laser OES is a powerful and versatile technology that makes it possible to chemically characterize materials at the microscopic level. It forms the basis for improved process and quality controls as well as new material developments in various branches of industry.

Where measurement technology becomes reality

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